Conventional Fourier ptychographic microscopy (FPM) and multiplexed FPM techniques suffer from limited acquisition speed and lack of aberration correction capacity. We present hybrid-illumination multiplexed Fourier ptychographic microscopy (HMFPM), which integrates analytic aberration extraction with the efficiency of multiplexed illumination. By combining a hybrid illumination strategy with a customized reconstruction algorithm that leverages both analytical and optimization methods, HMFPM substantially reduces the number of required measurements while maintaining robust aberration correction and stable convergence.

We recently discovered a phenomenon that the digitally summed Fourier spectrum of two images acquired from two-angle illumination exhibits interference-like fringe modulation when the sample is out-of-focus. These digital fringes correlate directly with defocus through a physics-based relation. Based on this principle, we developed an automatic, efficient, and generalizable defocus detection method termed digital defocus aberration interference (DAbI).

We report a whole slide imaging system based on angular ptychographic imaging with a closed-form solution (WSIAPIC), which offers efficient, tens-of-gigapixels, large-FOV, aberration-free imaging. WSI-APIC utilizes oblique incoherent illumination for initial high-level segmentation, thereby bypassing unnecessary scanning of the background regions and enhancing image acquisition efficiency. A GPU-accelerated APIC algorithm analytically reconstructs phase images with effective digital aberration corrections and improved optical resolutions. An auto-stitching technique based on scale-invariant feature transform ensures the seamless concatenation of whole slide complex-field images.